Основные причины возникновения микроплазм в pn переходе кремниевых диодов

dc.contributor.authorМарат Тагаев
dc.contributor.authorАли Абдреймов
dc.contributor.authorЖасмина Хожамуратова
dc.date.accessioned2025-12-30T18:22:50Z
dc.date.issued2024-06-22
dc.description.abstractAssumptions that the emission of light from microplasma is closely related to impact ionization, because with the disappearance of light emission, impact ionization also disappears. The change in the current-voltage characteristic associated with the appearance of microplasma decreases with increasing ambient temperature, and therefore the additional conductivity associated with microplasma decreases. At sufficiently high temperatures, the break in the current-voltage characteristic, corresponding to the appearance of microplasma, disappears and, in connection with this, the temperature dependence of the breakdown voltage or current also changes.
dc.formatapplication/pdf
dc.identifier.urihttps://academiaone.org/index.php/6/article/view/864
dc.identifier.urihttps://asianeducationindex.com/handle/123456789/33690
dc.language.isoeng
dc.publisherAcademia One
dc.relationhttps://academiaone.org/index.php/6/article/view/864/720
dc.rightshttps://creativecommons.org/licenses/by-nc/4.0
dc.sourceOpen Herald: Periodical of Methodical Research; Vol. 2 No. 6 (2024): Open Herald; 28-32
dc.source2810-6385
dc.subjectavalanche breakdown
dc.subjectmicroplasma
dc.subjectdislocations
dc.titleОсновные причины возникновения микроплазм в pn переходе кремниевых диодов
dc.typeinfo:eu-repo/semantics/article
dc.typeinfo:eu-repo/semantics/publishedVersion
dc.typePeer-reviewed Article

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