Modes Of Atomic Force Microscopy In Investigation Of The Surface Topography Of Nickel-Doped Silicon Solar Cell.

dc.contributor.author	Adilbek Sayt-Muratovich Kulumbetov
dc.date.accessioned	2026-01-02T11:47:34Z
dc.date.issued	2023-12-28
dc.description.abstract	This work describes the operating modes of atomic force microscopy (AFM), as well as its application in the study of various impurity silicon. The difference between using AFM in contact and semi-contact mode is shown. It is assumed that the combined use of these two modes in the study of impurity silicon is optimal.
dc.format	application/pdf
dc.identifier.uri	https://geniusjournals.org/index.php/ejpcm/article/view/5486
dc.identifier.uri	https://asianeducationindex.com/handle/123456789/78185
dc.language.iso	eng
dc.publisher	Genius Journals
dc.relation	https://geniusjournals.org/index.php/ejpcm/article/view/5486/4608
dc.rights	https://creativecommons.org/licenses/by-nc-nd/4.0
dc.source	Eurasian Journal of Physics,Chemistry and Mathematics; Vol. 25 (2023): EJPCM; 40-45
dc.source	2795-7667
dc.subject	atomic force microscopy
dc.subject	silicon
dc.subject	nickel-doped silicon
dc.title	Modes Of Atomic Force Microscopy In Investigation Of The Surface Topography Of Nickel-Doped Silicon Solar Cell.
dc.type	info:eu-repo/semantics/article
dc.type	info:eu-repo/semantics/publishedVersion
dc.type	Peer-reviewed Article

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