FIRST-PRINCIPLES BAND STRUCTURE OF SILICON AND GERMANIUM THIN FILMS

dc.contributor.authorYorkulov Ruslan
dc.date.accessioned2025-12-28T20:20:16Z
dc.date.issued2024-05-31
dc.description.abstractIn nanomaterials, optical anisotropies reveal a fundamental relationship between structural and optical properties, in which directional optical properties can be exploited to enhance the performance of optoelectronic devices. First principles calculation based on density functional theory (DFT) with the generalized gradient approximation (GGA) are carried out to investigate the energy band gap structure on silicon (Si) and germanium (Ge) nanofilms. Simulation results show that the band gaps in Si (100) and Ge (111) nanofilms become the direct-gap structure in the thickness range less than 7.64 nm and 7.25 nm respectively, but the band gaps of Si (111) and Ge (110) nanofilms still keep in an indirect-gap structure and are independent on film thickness, and the band gaps of Si (110) and Ge (100) nanofilms could be transferred into the direct-gap structure in nanofilms with smaller thickness. It is amazing that the band gaps of Si(1−x)/2GexSi(1−x)/2 sandwich structure become the direct-gap structure in a certain area whether (111) or (100) surface. The band structure change of Si and Ge thin films in three orientations is not the same and the physical mechanism is very interesting, where the changes of the band gaps on the Si and Ge nanofilms follow the quantum confinement effects.
dc.formatapplication/pdf
dc.identifier.urihttps://sjird.journalspark.org/index.php/sjird/article/view/1048
dc.identifier.urihttps://asianeducationindex.com/handle/123456789/13881
dc.language.isoeng
dc.publisherJournals Park Publishing
dc.relationhttps://sjird.journalspark.org/index.php/sjird/article/view/1048/1005
dc.sourceSpectrum Journal of Innovation, Reforms and Development; Vol. 27 (2024); 140-146
dc.source2751-1731
dc.subjectdirect band gap, first principles calculation, quantum confinement effect, nanofilms
dc.titleFIRST-PRINCIPLES BAND STRUCTURE OF SILICON AND GERMANIUM THIN FILMS
dc.typeinfo:eu-repo/semantics/article
dc.typeinfo:eu-repo/semantics/publishedVersion
dc.typePeer-reviewed Article

item.page.files

item.page.filesection.original.bundle

pagination.showing.labelpagination.showing.detail
loading.default
thumbnail.default.alt
item.page.filesection.name
ruslan_2024_first-principles_band_structure_of_silic.pdf
item.page.filesection.size
544.28 KB
item.page.filesection.format
Adobe Portable Document Format

item.page.collections