STUDY OF THE CRITICAL ANGLE OF CHANNELING OF ACTIVE METAL IONS THROUGH THIN ALUMINUM FILMS

loading.default
thumbnail.default.alt

item.page.date

item.page.authors

item.page.journal-title

item.page.journal-issn

item.page.volume-title

item.page.publisher

American Journals

item.page.abstract

Spatial distributions of ions (K+, Na+) passed through thin single-crystal Al films with thicknesses from 180 to 600 Å and critical channeling angles were studied. Ion energy varied within E0 = 10−30 keV. It was shown that increasing the primary ion beam energy leads to a decrease in the width of the angular distribution maxima, which is associated with a decrease in the critical channeling angle ψcr. It was found that ψcr for axial channeling does not exceed 4−5◦, and for planar channeling — 9−10◦.

item.page.description

item.page.citation

item.page.collections

item.page.endorsement

item.page.review

item.page.supplemented

item.page.referenced