STUDY OF THE CRITICAL ANGLE OF CHANNELING OF ACTIVE METAL IONS THROUGH THIN ALUMINUM FILMS

dc.contributor.author	Yorkulov Ruslan
dc.date.accessioned	2025-12-29T09:31:30Z
dc.date.issued	2024-12-13
dc.description.abstract	Spatial distributions of ions (K+, Na+) passed through thin single-crystal Al films with thicknesses from 180 to 600 Å and critical channeling angles were studied. Ion energy varied within E0 = 10−30 keV. It was shown that increasing the primary ion beam energy leads to a decrease in the width of the angular distribution maxima, which is associated with a decrease in the critical channeling angle ψcr. It was found that ψcr for axial channeling does not exceed 4−5◦, and for planar channeling — 9−10◦.
dc.format	application/pdf
dc.identifier.uri	https://americanjournal.org/index.php/ajper/article/view/2552
dc.identifier.uri	https://asianeducationindex.com/handle/123456789/15952
dc.language.iso	eng
dc.publisher	American Journals
dc.relation	https://americanjournal.org/index.php/ajper/article/view/2552/2389
dc.rights	https://creativecommons.org/licenses/by-nc/4.0
dc.source	American Journal of Pedagogical and Educational Research; Vol. 31 (2024); 57-61
dc.source	2832-9791
dc.subject	Critical angle, ion passage, angular distribution, channeling, spatial distribution.
dc.title	STUDY OF THE CRITICAL ANGLE OF CHANNELING OF ACTIVE METAL IONS THROUGH THIN ALUMINUM FILMS
dc.type	info:eu-repo/semantics/article
dc.type	info:eu-repo/semantics/publishedVersion
dc.type	Peer-reviewed Article

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